MIGDAL HAEMEK, Israel, June 29, 2015

Jordan Valley (JV), a leading supplier of X-ray based in-line metrology solutions for advanced semiconductor manufacturers, today announced that it has received orders for its latest generation JVX7300HR front-end-of-line (FEOL) strain & thin-film metrology tool from multiple foundries in Asia.

The innovative JVX7300HR tool provides in-line, first principle metrology for product-wafers at the 28 nm, and below, technology nodes. The high-resolution X-ray diffraction (HRXRD) measurement channel provides a unique monitoring capability for epitaxial materials, such as SiGe, Si:C, Si:P, providing information on strain and epitaxial quality on both bulk Si and (FD)SOI substrates. Additionally, the X-ray reflectivity (XRR) channel provides thin-film thickness monitoring for complex stacking including high-k / metal gate (HKMG) stack analysis

Dr. Alex Tokar, JV's worldwide applications manager explained that JVX7300HR was developed with the unique challenges that the advanced technology nodes pose. The tool provides superior performance to its competitors for complex multi-layer epi and HKMG stacks. High-throughput X-ray metrology provides unique capabilities compared to traditional optical techniques with improved productivity and hence reduced CoO. The JVX7300HR provides advanced capabilities such as reciprocal space maps (RSMs) on product wafers for development and production ramp and hybrid metrology support.

Isaac Mazor, JV's CEO added: "Our unique Fast HRXRD and XRR technologies have been proven to be crucial for process ramp-up and in-line metrology, especially for epi. quality monitoring. The JVX7300HR was designed based on our experience gained working in the fabs of the leading logic players. Our existing customers appreciate our experience in providing unique X-ray based metrology solutions. Our customers benefit from the JVX7300 from faster process ramp-up and control with a lower cost of measurement."

About the JVX7300HR production metrology tool

The JVX7300HR is a production worthy X-ray metrology tool combining XRR and HRXRD channels. The tool targets FEOL applications for the 28nm technology node and below. The JVX7300HR supersedes the JVX7200HR (Best-of-West 2010 award winner)

Jordan Valley's management will attend Semicon West in San Francisco on July 14-16, 2015. To schedule a meeting, please contact This email address is being protected from spambots. You need JavaScript enabled to view it.

About Jordan Valley Semiconductors Ltd.

Jordan Valley Semiconductors (JVS), the leader in X-ray metrology and crystalline defect detection tools for the semiconductor industry. Jordan Valley's tools are fully automated non-contacting and non-destructive tools designed for production control on patterned or blanket wafers.

The company offers the semiconductor industry the most comprehensive portfolio of advanced metrology and defect inspection tools, based on X-ray technologies such as XRR (X-ray reflectometry), XRF (X-ray fluorescence), XRD (X-ray diffraction) and others.

Jordan Valley's investors include Clal Industries and Investments Ltd. (TASE:CII), Intel Capital (INTC) and Elron Electronics Industries Ltd. (ELRN.TA). With headquarters in Migdal Haemek Israel, the company has subsidiaries in Durham UK, Austin TX, USA, Hsin-Chu Taiwan, Suwon Korea and other offices and sales representatives worldwide.

For more information:
Gali Ashkenazi
Tel: +972-4654-3666
Email: This email address is being protected from spambots. You need JavaScript enabled to view it.