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JVSensus

X-Ray Diffraction Imaging (XRDI) inspection system that detects crystalline defects in patterned and blanket wafers I...

JVX7200

New X-ray metrology for advanced front-end processes The latest multichannel platform from Jordan Valley, the JVX7200™,...

JVX7300LMI

Scanning HRXRD, XRR, WA-XRD for sub 20nm Si logic R&D, process development and production process monitoring on blan...

JVX6200 series

The JVX6200 Series Production-line proven X-ray metrology platform for FEOL, BEOL and WLP The JVX 6200 multichannel pla...

JVX6200iF Galaxy

The JVX6200iF Galaxy Production-line proven X-ray metrology platform for μ-bump Sn/Ag composition. Micro spot XR...

JVX6200iRF

JVX6200iRF In-line X-ray metrology platform for FEOL, MEOL & BEOL for the semiconductors industry JVX6200iRF&...

QC3

QC3 is a High Resolution XRD (HRXRD) system for epilayers (thin films). It is designed for high-throughput, mass product...

RADS Software

RADS software (patented) is the leading simulation, analysis & fit software for HRXRD of epitaxial thin-film structu...

QC-TT

X-Ray Diffraction Imaging (XRDI) inspection system that detects crystalline defects in patterned and blanket wafers I...

QC-Velox

The Jordan Valley QC-Velox is a next-generation High Resolution XRD (HRXRD) system for epilayers (thin films), targeting...

QC-RT

X-Ray Diffraction Imaging (XRDI) reflection inspection system that detects crystalline defects in patterned and blanket ...

Delta-X

Jordan Valley's Delta-X is the latest generation of flexible X-ray diffraction instruments for thin-film materials resea...

Latest News

Leading Equipment Manufacturer Selects JVX7300RF-W for Process Develop…

Multiple Foundries in Asia Select JVX7300HR X-ray Metrology Tool

Leading HDD Manufacturer Adopts Jordan Valley's JVX7300RF (XRR&XRF…

AIXTRON, Inc. Selects Jordan Valley QC3 for Advanced MOCVD Process Met…

JVS Wins More Market Share in Advanced Wafer Level Packaging

Multiple Customers Select JVS for Inline GaN/Si Process Control

NanoKTN Helps Steer UK’s Commercial Exploitation of European Silicon W…

Leading Semiconductor Players Select JVX7300LMI for 14nm & 10nm Pr…

Jordan Valley Named Mr. Sharon Laor Vice President of Sales

Leading Foundry in Asia adopts Jordan Valley’s new JVSensus™

Repeat Orders for Sub-20nm JVX7300HR

QC3 awarded CS Industry 2013 metrology, test and measurement award.

Jordan Valley Named Among Deloitte's Fast 50 Israel Technology Compani…

Video: Jordan Valley's 300/450mm NVD Defect Tool with SST

Jordan Valley wins NECC Expanded Horizons award

Jordan Valley QC-TT Announced as Winner of Best of West 2012

Jordan Valley QC-TT Announced as Best of West 2012 Finalist

Jordan Valley named among 2011 50 fastest growing companies in Israel …